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Wafer is a very thin slice of silicon crystal which is used to produce the actual detectors. The production line at VTT can make wafers up to 200 mm in diameter using planar technology. Furthermore, the thickness of the strip detectors is only 150 μm or 300 μm which can be implemented for different bias configurations. Area of the detectors is from 5 x 5 cm2 to 1 x 1 cm2. Interestingly, the modern fabrication techniques such as etching, planarization, lithography and bonding are applied. The most important thing is that leakage currents of the detectors are under few nanoamperes, which makes it acceptable for radiation detection. [2].

 

Conclusion

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References


  1.  Rehak, P. ; Brookhaven Nat. Lab., Upton, NY, USA. Silicon radiation detectors [online]. Nuclear Science Symposium Conference Record, 2003 IEEE  (Volume:5 ); 19-25 Oct. 2003, 2492-2497.

    URL: http://ieeexplore.ieee.org.ezproxy.metropolia.fi/stamp/stamp.jsp?tp=&arnumber=1352629, Accessed 16 March 2014.


  2. Virolainen, T. ; Kamarainen, V. ; Ji, F. ; Garcia, F. ; Orava, R. ; van Remortel, N. ; Santala, M. Silicon radiation detector development at VTT [online]. Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE  (Volume:2 ); Oct. 26 2007-Nov. 3 2007, 1494-1497.

    URL: http://ieeexplore.ieee.org.ezproxy.metropolia.fi/stamp/stamp.jsp?tp=&arnumber=4437282, Accessed 16 March 2014.


  3. Huhtinen, M. ; Res. Inst. for High Energy Phys., Helsinki, Finland ; Orava, R. ; Pimia, M. ; Tuuva, T. Single sided stereo angle silicon strip detector [online]. Nuclear Science, IEEE Transactions on  (Volume:40 ,  Issue: 4 ); Aug 1993, 227-229.

    URL: http://ieeexplore.ieee.org.ezproxy.metropolia.fi/stamp/stamp.jsp?tp=&arnumber=256575, Accessed 16 March 2014.


  4.  Yossi Eisen, Asher Shor, Israel Mardor (2004) CdTe and CdZnTe X-Ray and Gamma-Ray Detectors for Imaging Systems. IEEE transactions on  nuclear science; June 2004, Val. 51, No. 3.
  5.  Tom Schulman (2006) Si, CdTe and CdZnTe radiation detectors for imaging applications. University of Helsinki, Finland; June 19, 2006.


  6.  AJAT Ltd. official webpage 

    URL:  http://www.ajat.fi/, Accessed 17 March 2014.



  7.  Detection Technology Oy official webpage

    URL: http://www.deetee.com/en_US/home.html, Accessed  5 April 2014.



  8. Marubun Corporation official webpage

    URL: http://www.marubun.co.jp/product/measurement/sensor/8ids6e000000k1lh-att/X100-7SMD.pdf, Accessed  5 April 2014.


  9. Cremat Inc. official webpage 

    URL: http://www.cremat.com/ , Accessed  10 April 2014.


  10. Jacob Fraden–3rd ed. Handbook of modern sensors : physics, designs, and applications. Springer-Verlag New York, Inc., USA; 2004

  11.  Integrated Digital conference Official website.  International Workshop on Semiconductor Pixel Detectors for Particles and Imaging. Hotel Listel Inawashiro, Inawashiro, Japan; 2-9 Spt. 2012.
     URL: http://indico.cern.ch/event/137337/material/slides/0?contribId=10&sessionId=5

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