VTT Technical Research Centre of Finland is the biggest multitechnological applied research organisation in Northern Europe. VTT provides high-end technology solutions and innovation services. VTT is a non-profit research organisation.
VTT Technical Research Centre of Finland has been developing strip silicon radiation detectors for many years. What is more, VTT have been closely working with CERN which conducts the most important experiments on particle physics in the world.
VTT was founded in 1942 for scientific and public utility. VTT has its headquarters in Otaniemi. VTT is originally an abbreviation of Finnish words "Valtion Teknillinen Tutkimuskeskus" (State Technical Research Center). The work was originally initiated with the activities inside the high energy research community. More recently the activities cover a range of industrial devices for the detection of light and soft X-rays as well as the devices for the physics experiments
Wafer is a very thin slice of silicon crystal which is used to produce the actual detectors. The production line at VTT can make wafers up to 200 mm in diameter using planar technology. Furthermore, the thickness of the strip detectors is only 150 μm or 300 μm which can be implemented for different bias configurations. Area of the detectors is from 5 x 5 cm2 to 1 x 1 cm2. Interestingly, the modern fabrication techniques such as etching, planarization, lithography and bonding are applied. The most important thing is that leakage currents of the detectors are under few nanoamperes, which makes it acceptable for radiation detection
VTT has been involved in many internation projects including:
- Okmetic Oyj
- Oxford Instruments Analytical Oy
- Detection Technology Oy
- Planmed Oy
- Mirion Technologies Oy
- CERN
- ESA
- Sintef
- FBK-IRST
- CNM-IMB
- Aalto University
- TKK
- HIP
- VTT official webpage, http://www.vtt.fi/
- Virolainen, T. ; Kamarainen, V. ; Ji, F. ; Garcia, F. ; Orava, R. ; van Remortel, N. ; Santala, M. Silicon radiation detector development at VTT [online]. Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE (Volume:2 ); Oct. 26 2007-Nov. 3 2007, 1494-1497.